14. JTAG Interface
JTDI JTAG serial data in
JTDO JTAG serial data out
JTMS JTAG test mode select
JTCK JTAG serial clock input
Figure 14-2 JTAG Interface Signals and Registers
The JTAG boundary-scan mechanism (referred to in this chapter as JTAG mechanism) allows testing of the connections between the processor, the printed circuit board to which it is attached, and the other components on the circuit board.
In addition, the JTAG mechanism provides rudimentary capability for low-speed logical testing of the secondary cache RAM. The JTAG mechanism does not provide any capability for testing the processor itself.
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